Technique for determining concentration profiles of boron impurities in substrates
- J.F. Ziegler
- G.W. Cole
- et al.
- 2003
- Journal of Applied Physics
Publications
2357 results at Journal of Applied Physics
Decay of surface potential in insulators
- K. Keiji Kanazawa
- I.P. Batra
- et al.
- 2003
- Journal of Applied Physics
X-ray topographic determination of the absence of lateral strains in ion-implanted silicon
- K.N. Tu
- P. Chaudhari
- et al.
- 2003
- Journal of Applied Physics
Deep-trapping kinematics
- K. Keiji Kanazawa
- I.P. Batra
- 2003
- Journal of Applied Physics
Laser writing and erasing on chalcogenide films
- R.J. Von Gutfeld
- P. Chaudhari
- 2003
- Journal of Applied Physics
The structure of electroplated and vapor-deposited copper films
- A. Gangulee
- 2003
- Journal of Applied Physics
X-ray study of interdiffusion in bimetallic CuSingle Bond signAu films
- K.N. Tu
- B.S. Berry
- 2003
- Journal of Applied Physics
Transient photocurrent for field-dependent mobilities
- W.D. Gill
- K. Keiji Kanazawa
- 2003
- Journal of Applied Physics
Formation of amorphous silicon by ion bombardment as a function of ion, temperature, and dose
- F.F. Morehead
- B.L. Crowder
- et al.
- 2003
- Journal of Applied Physics
A study of the initial photocurrent due to pulsed light absorbed in finite thickness
- H. Seki
- 2003
- Journal of Applied Physics