Special session 8: New topics at-speed testing in the face of process variations
- Chandu Visweswariah
- Vladimir Zolotov
- et al.
- 2009
- VTS 2009
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2 results at VTS 2009
A scalable, digital BIST circuit for measurement and compensation of static phase offset
- Keith A. Jenkins
- Lionel Li
- 2009
- VTS 2009