Analysis of retention time distribution of embedded DRAM - A new mMethod to characterize across-chip threshold voltage variation
- W. Kong
- P. Parries
- et al.
- 2008
- IEEE ITC 2008
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3 results at IEEE ITC 2008
Optical diagnostics for IBM POWER6 TM Microprocessor
- Peilin Song
- Stephen Ippolito
- et al.
- 2008
- IEEE ITC 2008
On-chip timing uncertainty measurements on IBM microprocessors
- R.L. Franch
- P. Restle
- et al.
- 2008
- IEEE ITC 2008