Evaluation of SCR-based ESD protection devices in 90nm and 65nm CMOS technologies
- James Di Sarro
- Kiran Chatty
- et al.
- 2007
- IRPS 2007
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.