Evaluation of SCR-based ESD protection devices in 90nm and 65nm CMOS technologies
- James Di Sarro
- Kiran Chatty
- et al.
- 2007
- IRPS 2007
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3 results at IRPS 2007
Role of Cu in TDDB of low-k dielectrics
- J.R. Lloyd
- S. Ponoth
- et al.
- 2007
- IRPS 2007
Product burn-in stress impacts on SRAM array performance
- Li Wang
- Qiuyi Ye
- et al.
- 2007
- IRPS 2007