Impact of NBTI induced statistical variation to SRAM cell stability
- Giuseppe La Rosa
- Wee Loon Ng
- et al.
- 2006
- IRPS 2006
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7 results at IRPS 2006
Minimum void size and 3-parameter lognormal distribution for em failures in Cu interconnects
- Baozhen Li
- Cathryn Christiansen
- et al.
- 2006
- IRPS 2006
Hot-carrier photoemission in scaled CMOS technologies: A challenge for emission based testing and diagnostics
- Alberto Tosi
- Franco Stellari
- et al.
- 2006
- IRPS 2006
Study of design factors affecting turn-on time of silicon controlled rectifiers (SCRs) in 90 and 65NM bulk CMOS technologies
- James Di Sarro
- Kiran Chatty
- et al.
- 2006
- IRPS 2006
Switching time extraction of CMOS gates using time-resolved emission (TRE)
- Franco Stellari
- Alberto Tosi
- et al.
- 2006
- IRPS 2006
A comprehensive study of low-k SiCOH TDDB phenomena and its reliability lifetime model development
- F. Chen
- O. Bravo
- et al.
- 2006
- IRPS 2006
Reliability qualification of CoSI2 electrical fuse for 90NM technology
- C. Tian
- B. Park
- et al.
- 2006
- IRPS 2006