Reliability issues in SiGe HBTs fabricated on CMOS-compatible thin-film SOI
- Marco Bellini
- Tianbing Chen
- et al.
- 2006
- BCTM 2006
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3 results at BCTM 2006
Quantitative analysis of errors in on-wafer S-parameter deembedding techniques for high frequency device modeling
- Rob Groves
- Wang Jing
- et al.
- 2006
- BCTM 2006
A BiCMOS technology featuring a 300/330 GHz (fT/fmax) SiGe HBT for millimeter wave applications
- B. Orner
- M. Dahlström
- et al.
- 2006
- BCTM 2006