Cross-talk and transit-time effects in stroboscopic voltage measurements via electron emission
- R. Clauberg
- A. Blacha
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
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7 results at Advances in Semiconductors and Semiconductor Structures 1987
Fundamentals of laser photoemission for testing high speed devices and circuits
- G.W. Rubloff
- H. Beha
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Measurement considerations for future high speed computer packaging
- G.V. Kopcsay
- G. Arjavalingam
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Picosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Photoelectron scanning electron microscope (PSEM) for high speed noncontact testing
- P.G. May
- J.-M. Halbout
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
High performance silicon bipolar technology
- G.-P. Li
- M.B. Ketchen
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Characterization of logic devices with photoconductively generated picosecond pulses
- J.-M. Halbout
- P.G. May
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987