Publications

7 results at Advances in Semiconductors and Semiconductor Structures 1987

Fundamentals of laser photoemission for testing high speed devices and circuits
- - G.W. Rubloff
  - H. Beha
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Measurement considerations for future high speed computer packaging
- - G.V. Kopcsay
  - G. Arjavalingam
  - et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Picosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- - A. Blacha
  - R. Clauberg
  - et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Photoelectron scanning electron microscope (PSEM) for high speed noncontact testing
- - P.G. May
  - J.-M. Halbout
  - et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
High performance silicon bipolar technology
- - G.-P. Li
  - M.B. Ketchen
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Characterization of logic devices with photoconductively generated picosecond pulses
- - J.-M. Halbout
  - P.G. May
  - et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Cross-talk and transit-time effects in stroboscopic voltage measurements via electron emission
- - R. Clauberg
  - A. Blacha
  - et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987

Fundamentals of laser photoemission for testing high speed devices and circuits