TESTABILITY DESIGN FOR MICRO/370, A SYSTEM/370 SINGLE-CHIP MICROPROCESSOR.
- F.Warren Shih
- H.H. Chao
- et al.
- 1985
- IEEE ITC 1985
Publications
Date
Featured collections
Popular topics
3 results at IEEE ITC 1985
EFFICIENT FAULT SIMULATION OF CMOS CIRCUITS WITH ACCURATE MODELS.
- Z. Barzilai
- J.Lawrence Carter
- et al.
- 1985
- IEEE ITC 1985
TRIM: TESTABILITY RANGE BY IGNORING THE MEMORY.
- Larry Carter
- Leendert M. Huisman
- et al.
- 1985
- IEEE ITC 1985