A New Clustering-Function-Based Formulation of Temporal and Spatial Clustering Model Involving Area Scaling and its Application to Parameter ExtractionErnest WuBrian McGowanet al.2024IRPS 2024
General Statistical Model for Dielectric Breakdown Including Reverse Area Scaling - The Role of Area-Dependent Dynamic CompetitionErnest WuTakashi Andoet al.2024IRPS 2024
Challenges of gate stack TDDB in gate-all-around nanosheet towards further scalingHuimei ZhouMiaomiao Wanget al.2024IRPS 2024
Challenges of gate stack TDDB in gate-allaround nanosheet towards further scalingHuimei ZhouMiaomiao Wanget al.2024IRPS 2024