The resilience wall: Cross-layer solution strategies
- Subhasish Mitra
- Pradip Bose
- et al.
- 2014
- VLSI-TSA 2014
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Temperature-dependent studies of the electrical properties and the conduction mechanism of HfOx-based RRAM
- Chiyui Ahn
- Seyoung Kim
- et al.
- 2014
- VLSI-TSA 2014