Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT
- Abhairaj Singh
- Moritz Fieback
- et al.
- 2022
- IEEE ITC 2022
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Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security
- Franco Stellari
- Peilin Song
- 2022
- IEEE ITC 2022