Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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3 results at ECS Meeting 2013

The past, present and future of high-k/metal gates
- - Kisik Choi
  - Takashi Ando
  - et al.
- 2013
- ECS Meeting 2013
Metal Gate/High-κ dielectric gate stack reliability; or how i learned to live with trappy oxides
- - Barry P. Linder
  - Eduard Cartier
  - et al.
- 2013
- ECS Meeting 2013
Deposited ALD SiO₂ high-k/metal gate interface for high voltage analog and I/O devices on next generation alternative channels and FINFET device structures
- - S. Siddiqui
  - M.M. Chowdhury
  - et al.
- 2013
- ECS Meeting 2013