DRC-free high density layout exploration with layout morphing and patterning quality assessment, with application to SRAM
- Amith Singhee
- Emrah Acar
- et al.
- 2012
- ISQED 2012
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A novel sample reuse methodology for fast statistical simulations with applications to manufacturing variability
- Rouwaida Kanj
- Rajiv Joshi
- 2012
- ISQED 2012