Publications

2 results at ECS Solid State Letters

Cu reflows on Ru
- - C.-C. Yang
  - Baozhen Li
  - et al.
- 2013
- ECS Solid State Letters
Aggressive SiGe channel gate stack scaling by remote Oxygen scavenging: Gate-first pFET performance and reliability
- - Martin M. Frank
  - Eduard A. Cartier
  - et al.
- 2012
- ECS Solid State Letters