Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam
- Andrew Ying
- Braxton Osting
- et al.
- 2010
- Journal of Applied Crystallography
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A rigorous comparison of X-ray diffraction thickness measurement techniques using silicon-on-insulator thin films
- Andrew J. Ying
- Conal E. Murray
- et al.
- 2009
- Journal of Applied Crystallography
X-ray powder diffraction analysis of silver behenate, a possible low-angle diffraction standard
- T.C. Huang
- H. Toraya
- et al.
- 1993
- Journal of Applied Crystallography
Array-type universal profile function for powder pattern fitting
- H. Toraya
- 1990
- Journal of Applied Crystallography