Performance-optimized design for parametric reliability
- Ramyanshu Datta
- Jacob A. Abraham
- et al.
- 2008
- Journal of Electronic Testing: Theory and Applications (JETTA)
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7 results at Journal of Electronic Testing: Theory and Applications (JETTA)
New march tests for multiport RAM devices
- Kanad Chakraborty
- Pinaki Mazumder
- 2000
- Journal of Electronic Testing: Theory and Applications (JETTA)
Testing for function and performance: towards an integrated processor validation methodology
- Pradip Bose
- 2000
- Journal of Electronic Testing: Theory and Applications (JETTA)
On-Chip Weighted Random Patterns
- Jacob Savir
- 1998
- Journal of Electronic Testing: Theory and Applications (JETTA)
Initialization of Sequential Circuits and its Application to ATPG
- Jalal A. Wehbeh
- Daniel G. Saab
- 1998
- Journal of Electronic Testing: Theory and Applications (JETTA)
Delay Test Generation: A Hardware Perspective
- Jacob Savir
- 1997
- Journal of Electronic Testing: Theory and Applications (JETTA)
Electron Beam Probing - A Solution for MCM Test and Failure Analysis
- R. Schmid
- R. Schmitt
- et al.
- 1997
- Journal of Electronic Testing: Theory and Applications (JETTA)