Characterization of lattice strain from DX centers and persistent photocarriers in GaAlAs
- G.S. Cargill III
- A. Segmüller
- et al.
- 1995
- Materials Chemistry & Physics
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Diffusion in several materials relevant to Cu interconnection technology
- D. Gupta
- 1995
- Materials Chemistry & Physics
Electromigration in two-level interconnects of Cu and Al alloys
- C.-K. Hu
- B. Luther
- 1995
- Materials Chemistry & Physics