Mark Lantz

Mark Lantz received B.Sc. (91) and M.Sc. (93) degrees in electrical engineering from the University of Alberta, Canada, and a Ph.D. from the University of Cambridge, U.K., in 1997 for work in the field of scanning probe microscopy and tribology. He then spent two years as a postdoctoral researcher at the Joint Research Center for Atom Technology in Japan, investigating the application of scanning probes in biophysics, followed by two years of research in the area of low temperature scanning force microscopy at the Physics Institute in the University of Basel, Switzerland.

Currently, Dr. Lantz is a Distinguished Research Scientist and the manager of the Tape Research Group in the IBM Research Europe– Zurich laboratory. Dr. Lantz has over twenty years of experience in storage technology research. He has been an IBM Master Inventor since 2011, is co-inventor on over 200 patents and a co-author of over 130 publications. His current research interests include storage technology, computational storage, storage system reliability and performance modeling.

Dr. Lantz became an IEEE Fellow in 2019 and was named IBM Master Inventor in 2011. He was co-recipient of the 2009 IEEE Transactions on Control Systems Technology Outstanding Paper Award, the 2009 IEEE CSS Control Systems Technology Award,  the 2011 IBM Research Pat Goldberg Memorial Best Paper Award and 2014 International Federation of Automatic Control Industrial Achievement Award.