3D-XY critical behavior in La2-xSrxCuO4 thin films probed by penetration depth measurement

Y. Jaccard; T. Schneider; J.P. Locquet; E.J. Williams; Ø. Fischer; P. Martinoli

doi:10.1007/BF02583847

Czechoslovak Journal of Physics

Paper

01 Dec 1996

3D-XY critical behavior in La_2-xSr_xCuO₄ thin films probed by penetration depth measurement

View publication

Abstract

We sketch the evidence for anisotropic 3D-XY critical behavior in La2-xSrxCuO4 thin films and explore the implications of this scenario, supplemented by the experimental phase transition line.

Paper

Critical dynamics of a model for distortive structural phase transitions

T. Schneider, E. Simanek

Journal of Physics C: Solid State Physics

Paper

Properties of the one-particle-displacement probability distribution in systems undergoing antiferrodistortive structural phase transitions

T. Schneider, E. Stoll

Physical Review B

Paper

Corrections to the lifshitz tail and the long-time behaviour of the trapping problem

A. Politi, T. Schneider

EPL

Paper

Schiff base precursor compounds for the chemical beam epitaxy of oxide thin films. I. Deposition of CuO on MgO[001] using copper (II) bis(benzoylacetone)-ethylendiimine

E. Fritsch, E. Mächler, et al.

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

View all publications

Abstract

Related

Critical dynamics of a model for distortive structural phase transitions

Properties of the one-particle-displacement probability distribution in systems undergoing antiferrodistortive structural phase transitions

Corrections to the lifshitz tail and the long-time behaviour of the trapping problem

Schiff base precursor compounds for the chemical beam epitaxy of oxide thin films. I. Deposition of CuO on MgO[001] using copper (II) bis(benzoylacetone)-ethylendiimine