A. Deutsch, W.D. Becker, et al.
IEEE Topical Meeting EPEPS 1996
Conference paper
A 1 mv MOS comparator
Abstract
A MOS comparator circuit capable of detecting ± 1 mV difference signals in 3 μs has been designed and tested. The circuit does not require high accuracy components or tight control of device parameter tolerences.
Related
Christophe R. Tretz, C.T. Chuang, et al.
IEEE International SOI Conference 1998
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 1997
A. Deutsch, G.V. Kopcsay, et al.
IEEE Topical Meeting EPEPS 1995