Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
This paper proposes a practical methodology for analyzing the impact of substrate noise in any sensitive circuit. From this methodology, a figure of merit (FOM) is presented which can be used to compute the sensitivity of a circuit node to substrate noise. Simulations of a CMOS LNA prove the usefulness of this approach as a expeditious, yet effective means for determining the most substrate noise-sensitive portions of a circuit. © 2005 IEEE.
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
C. Zhou, Keith A. Jenkins, et al.
IRPS 2018
Stas Polonsky, Keith A. Jenkins
ISDRS 2003
Keith A. Jenkins, Eduard Cartier, et al.
IEEE Electron Device Letters