C.E. Murray, H. Yan, et al.
Journal of Applied Physics
Paper
A comparison of grain size measurements in Al-Cu thin films: Imaging verses diffraction techniques
Abstract
No abstract available.
Related
K.P. Rodbell, L. Gignac, et al.
Journal of Applied Physics
C. K. Hu, James Kelly, et al.
IITC 2017
C.E. Murray, C.C. Goldsmith, et al.
Powder Diffraction