Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
The bipolar transistor and FET axe compared, considering both today's most advanced implementations and “ultimate” scaled-down devices. The differences between die devices are quantified in terms of transconductance and intrinsic speed. Old limits are re-examined and ways of extending the devices toward their ultimate in performance are proposed. While the major emphasis is on silicon, a comparison is made with the GaAs MESFET. Other semiconductor devices are discussed in the context of “bipolar-like” and “FET-like” devices, and the HEMT is considered a very promising candidate for high-speed logic. While Josephson junction logic is not discussed at length, it is a continual point of reference. In addition to comparing devices, the on-chip wiring environment is discussed, especially concerning its impact on power-delay products. Copyright © 1982 by The Institute of Electrical and Electronics Engineers, Inc.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Nanda Kambhatla
ACL 2004
Ruixiong Tian, Zhe Xiang, et al.
Qinghua Daxue Xuebao/Journal of Tsinghua University
Joel L. Wolf, Mark S. Squillante, et al.
IEEE Transactions on Knowledge and Data Engineering