PaperInfluence of misfit dislocations on the alignment of epitaxial thin filmsJ.W. MatthewsThin Solid Films
PaperThe interpretation of dislocation contrast in x-ray topographs of GaAs 1-x PxS. Mader, A.E. Blakeslee, et al.Journal of Applied Physics
PaperEffects of a stress field on boron ion implantation damage in siliconJ.D. Mis, S. Mader, et al.Journal of Applied Physics
