Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A new measurement technique is described that records the ferrimagnetic saturation curve in a way that permits the Suhl critical field to be evaluated directly from the recording. This technique eliminates the tedious task of constructing point by point saturation curves for evaluating the critical field and shortens immensely the time required to determine spinwave linewidths from the saturation of the ferrimagnetic resonance line. Copyright © 1962–The Institute of Radio Engineers, Inc.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Michiel Sprik
Journal of Physics Condensed Matter
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films