Conference paper
Experimental 27 ns 1 Mb CMOS high-speed DRAM
S. Dhong, W.H. Henkels, et al.
VLSI Circuits 1989
A technique for accurately measuring small superconductive inductances is presented. The inductance to be measured is inserted into a two-junction interferometer into which control current is directly injected. The method was used to measure the penetration depth of a Pb-In-Au alloy film and the effect of magnetic field fringing into a narrow superconductive stripline.
S. Dhong, W.H. Henkels, et al.
VLSI Circuits 1989
W.H. Henkels, L.M. Geppert, et al.
Journal of Applied Physics
W.H. Henkels, L.M. Geppert, et al.
Journal of Applied Physics
W.H. Henkels, W. Hwang
IEEE Journal of Solid-State Circuits