A New Failure Mode of Radiation-Induced Soft Errors in Dynamic Memories
- T.V. Rajeevakumar
- Nicky C. C. Lu
- et al.
- 1988
- IEEE Electron Device Letters
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27 results for W.H. Henkels
Experimental Single Flux Quantum NDRO Josephson Memory Cell
- Walter H. Henkels
- James H. Greiner
- 1979
- IEEE JSSC
An Experimental 64-Bit Decoded Josephson NDRO Random Access Memory
- Walter H. Henkels
- Hans H. Zappe
- 1978
- IEEE JSSC
660 MHz self-resetting 8 port, 32×64 bits register file and latch in 0.25 μm SOI technology
- R.V. Joshi
- W. Hwang
- et al.
- 1998
- IEEE International SOI Conference 1998
Pulse-to-static conversion latch with a self-timed control circuit
- W. Hwang
- R.V. Joshi
- et al.
- 1997
- ICCD 1997
500 MHz 32-word×64-bit 8-port self-resetting CMOS register file and associated dynamic-to-static latch
- W.H. Henkels
- W. Hwang
- et al.
- 1997
- VLSI Circuits 1997
Experimental 27 ns 1 Mb CMOS high-speed DRAM
- S. Dhong
- W.H. Henkels
- et al.
- 1989
- VLSI Circuits 1989
Low temperature 12 ns DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- VLSI-TSA 1989
Low temperature SER and noise in a high speed DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- Workshop on Low Temperature Semiconductor Electronics 1989
Experimental low temperature DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- VLSI Circuits 1989