The DX centre
T.N. Morgan
Semiconductor Science and Technology
Low-energy electron microscopy and diffraction not only allow one to determine the structure of adsorption-induced surface phases, but also to follow the nucleation and motion of phase boundaries as well as the surface material transport associated with phase transformation, decomposition, and desorption. By use of these methods for the well-known Al/Si(111) system, unexpected phase relations are uncovered—such as the thermal decomposition of the (√7×√7)R19.1° phase into a disordered and a strained substitutional phase—and these relations are linked to surface atomic mechanisms. © 1996 The American Physical Society.
T.N. Morgan
Semiconductor Science and Technology
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures