Conference paper
Thermal instability of the Cu-Ni interface above 200°C
T.H. Westmore, J.E.E. Baglin, et al.
MRS Spring Meeting 1998
A novel diffusion "marker" has been used in the backscattering study of the formation of Mo and W silicide films. Because of their closely similar crystallographic and chemical characteristics, Mo and W may be regarded as equivalent atoms in a diffusion process. Hence, in the formation of WSi 2 and MoSi2 by interaction of a bilayer film of W+Mo with substrate Si, the interface between the W and Mo (observable by backscattering) becomes a "marker" to permit identification of the moving species (Si at T<1000°C).
T.H. Westmore, J.E.E. Baglin, et al.
MRS Spring Meeting 1998
J.E.E. Baglin, Shouheng Sun, et al.
MRS Proceedings 2003
Shouheng Sun, Simone Anders, et al.
JACS
C.S. Petersson, J.E.E. Baglin, et al.
Journal of Applied Physics