Walter H. Henkels, James H. Greiner
IEEE JSSC
The design and testing of an experimental fully decoded 64-bit Josephson NDRO random access memory chip are described. Tree decoders were used to access the memory cells. The basic memory cell was a ring cell containing a single write gate. The chips were built in a coarse 25 μm technology since neither speed nor density were stressed in this study. an access time of 4 ns with full margins and of 2.3 ns with reduced margins were demonstrated. The corresponding full memory cycle times were 5 and 3.5 ns, respectively. Good agreement with computer simulations was obtained throughout. Copyright © 1978 by The Institute of Electrical and Electronics Engineers, Inc.
Walter H. Henkels, James H. Greiner
IEEE JSSC
Hans H. Zappe
IEEE Transactions on Magnetics
Walter H. Henkels, Nicky C. C. Lu, et al.
IEEE T-ED
T.V. Rajeevakumar, Nicky C. C. Lu, et al.
IEEE Electron Device Letters