Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
The stress of gold electrodeposited on membranes of Si, SiC, SiN, and BN was measured using a high precision resonant frequency technique. Measurements were made at room temperature (RT) and between 20 and 350 °C. After annealing, the RT stress was always more tensile than the as deposited stress. This is caused by plastic deformation of the gold at high temperature, resulting from its higher expansion coefficient relative to the substrate. © 1992.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
K.N. Tu
Materials Science and Engineering: A
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics