Mihir Parikh, James T. Hall, et al.
Physical Review A
SE yield (δ0) data can be interpreted in terms of the Fano plot, thereby yielding a simple formulation of δ0 with respect to the incident electron energy T and a correlation between the mean ionization potential 〈I〉 and a parameter in the Fano plot.
Mihir Parikh, James T. Hall, et al.
Physical Review A
Mihir Parikh
Journal of Applied Physics
Mihir Parikh
Journal of Applied Physics
Mihir Parikh, David F. Kyser
Journal of Applied Physics