PaperStudy of planarization of cobalt silicide lines and silicon surfaces by scanning force microscopy and scanning electron microscopyK.-H. Robrock, K.N. Tu, et al.Applied Physics Letters
PaperElectrical transport properties of transition-metal disilicide filmsF. Nava, K.N. Tu, et al.Journal of Applied Physics
PaperIrreversible processes of spontaneous whisker growth in bimetallic Cu-Sn thin-film reactionsK.N. TuPhysical Review B
ReviewElectrical and optical properties of silicide single crystals and thin filmsF. Nava, K.N. Tu, et al.Materials Science Reports
