E. Stoll
Surface Science
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å. © 1987 IOP Publishing Ltd.
E. Stoll
Surface Science
M. Baumberger, E. Stoll, et al.
Physical Review B
E. Eleftheriou, P. Bächtold, et al.
VLDB 2003
E. Stoll, O. Marti
Surface Science