E. Stoll
Advances in Image Processing and Pattern Recognition 1985
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å. © 1987 IOP Publishing Ltd.
E. Stoll
Advances in Image Processing and Pattern Recognition 1985
T. Schneider, E. Stoll
Physical Review Letters
G. Binnig, H. Rohrer
Compressed Air
G. Binnig
Ultramicroscopy