T. Schneider, E. Stoll
Physical Review B
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å. © 1987 IOP Publishing Ltd.
T. Schneider, E. Stoll
Physical Review B
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Physical Review Letters
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Surface Science
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IEDM 2003