M.I. Lutwyche, M. Despont, et al.
Applied Physics Letters
Paper
Atomic resolution with atomic force microscope
Abstract
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å. © 1987 IOP Publishing Ltd.
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