Conference paperImaging at high beam energies in the scanning electron microscopeL. Gignac, S.H. Boettcher, et al.M&M 2006
PaperVoltage measurement in the scanning electron microscopeO.C. Wells, C.G. BremerJournal of Physics E: Scientific Instruments
PaperMethod for examining solid specimens with improved resolution in the scanning electron microscope (SEM)O.C. Wells, A.N. Broers, et al.Applied Physics Letters
Conference paperBimodal electromigration mechanisms in dual-damascene Cu line/via on WC.-K. Hu, L. Gignac, et al.IITC 2002
