Backscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detector

L. Krusin-Elbaum, T. Shibauchi, et al.

Nature

S. Guha, E. Cartier, et al.

Journal of Applied Physics

C.-K. Hu, L. Gignac, et al.

Applied Physics Letters

J.M.E. Harper, C. Cabral Jr., et al.

MRS Spring Meeting 1999