PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning
ReviewEffect of metal liner on electromigration in Cu Damascene linesC.-K. Hu, L. Gignac, et al.Journal of Applied Physics
PaperMethod for examining solid specimens with improved resolution in the scanning electron microscope (SEM)O.C. Wells, A.N. Broers, et al.Applied Physics Letters
PaperComparison of Cu electromigration lifetime in Cu interconnects coated with various capsC.-K. Hu, L. Gignac, et al.Applied Physics Letters
