Imaging at high beam energies in the scanning electron microscope
- L. Gignac
- S.H. Boettcher
- et al.
- 2006
- M&M 2006
Publications
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52 results for O.C. Wells
Past, present, and future of backscatter electron (BSE) imaging
- Oliver C. Wells
- Michael S. Gordon
- et al.
- 2012
- ScMi 2012
The fiftieth anniversary of the first applications of the scanning electron microscope in materials research
- Kenneth C.A. Smith
- Oliver C. Wells
- et al.
- 2006
- IC-CPO 2006
The early history and future of the SEM
- Oliver C. Wells
- David C. Joy
- 2006
- Surface and Interface Analysis
The history and future of the SEM - A personal view
- Oliver C. Wells
- 2006
- M&M 2006
Applications of image diagnostics to metrology quality assurance and process control
- John A. Allgair
- Victor V. Boksha
- et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Studies of poorly conducting samples by the low-loss electron method in the scanning electron microscope
- O.C. Wells
- S. Rishton
- 1994
- MSA Annual Meeting 1994
Explanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory - a historical review
- O.C. Wells
- 1993
- MSA Annual Meeting 1993
In-lens magnetically filtered detector for scanning electron microscope
- O.C. Wells
- E. Munro
- et al.
- 1991
- Institute of Physics Electron Microscopy and Analysis Group Conference 1991
MEASURING THE FIELD FROM A MAGNETIC RECORDING HEAD IN THE SCANNING ELECTRON MICROSCOPE.
- O.C. Wells
- P. Coane
- et al.
- 1982
- Microbeam Analysis 1982