Conference paper
Reliability projection for ultra-thin oxides at low voltage
J.H. Stathis, D.J. DiMaria
IEDM 1998
J.H. Stathis, D.J. DiMaria
IEDM 1998
D.J. DiMaria, J.H. Stathis
Journal of Applied Physics
B.P. Linder, J.H. Stathis
INFOS 2003
K. Zhao, J.H. Stathis, et al.
IRPS 2011