Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A buckling instability in a system where a straight edge crack lies at the interface between a thin elastic film and a substrate is analysed theoretically and experimentally, The buckling, which can occur also under remote tensile loads, may result in crack growth before the conventional criterion for fracture is met on the straight crack front by enhancing the mode adjusted crack driving force. If crack growth occurs, buckling will cause a wavy crack front to develop. © 1995 by ASME.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A. Krol, C.J. Sher, et al.
Surface Science
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
T.N. Morgan
Semiconductor Science and Technology