Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
No abstract available.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
W.F. Cody, H.M. Gladney, et al.
SPIE Medical Imaging 1994
Simeon Furrer, Dirk Dahlhaus
ISIT 2005