R.F. Broom, H.P. Meier, et al.
Journal of Applied Physics
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
R.F. Broom, H.P. Meier, et al.
Journal of Applied Physics
R.F. Broom
Solid-State Electronics
H.P. Meier, R.F. Broom, et al.
Journal of Crystal Growth
D.G. Schlom, D. Anselmetti, et al.
Zeitschrift für Physik B Condensed Matter