R.F. Broom, A. Oosenbrug, et al.
Applied Physics Letters
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
R.F. Broom, A. Oosenbrug, et al.
Applied Physics Letters
R.F. Broom
Solid-State Electronics
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Applied Physics Letters