Conference paper
Properties of Zn implanted GaN
S. Strite, P.W. Epperlein, et al.
MRS Fall Meeting 1995
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
S. Strite, P.W. Epperlein, et al.
MRS Fall Meeting 1995
N.I. Buchan, A. Jakubowicz, et al.
Applied Physics Letters
R.F. Broom, W. Jutzi, et al.
IEEE Transactions on Magnetics
R.F. Broom
Journal of Applied Physics