Conference paper
Measurement of spectral dynamics in single quantum well lasers
M. Kesler, G. Arjavalingam
Proceedings of SPIE 1989
A method for completely characterizing resistive transmission lines by short-pulse propagation is described. Using the loss and dispersion of pulses propagated on two different lengths of line, together with the measured low-frequency capacitance, the frequency-dependent propagation constant, attenuation, and the complex impedance are determined. The basic method is demonstrated with results from low-loss cables and a well-controlled coplanar waveguide sample. © 1992, IEEE. All rights reserved.
M. Kesler, G. Arjavalingam
Proceedings of SPIE 1989
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