Conference paper
Intra-system interconnects for digital communications
A. Deutsch, G. Arjavalingam, et al.
ECTC 1994
A method for completely characterizing resistive transmission lines by short-pulse propagation is described. Using the loss and dispersion of pulses propagated on two different lengths of line, together with the measured low-frequency capacitance, the frequency-dependent propagation constant, attenuation, and the complex impedance are determined. The basic method is demonstrated with results from low-loss cables and a well-controlled coplanar waveguide sample. © 1992, IEEE. All rights reserved.
A. Deutsch, G. Arjavalingam, et al.
ECTC 1994
G. Arjavalingam, N. Theophilou, et al.
The Journal of Chemical Physics
W. Robertson, G. Arjavalingam, et al.
Physical Review Letters
N.R. Adiga, G. Almasi, et al.
ACM/IEEE SC 2002