Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Single crystals of CaF2 and Ca1-xSrxF2 were grown by the Czochralski technique and doped with varying concentrations of samarium. Complete solid solution was found in the CaF2-SrF2 pseudobinary system with a minimum near 50% CaF2 at 1330°C ± 10°C. The concentration of Sm +2 depended on the melt concentrations of SmF3 and Sm metal, and the samarium segregation coefficient did not change significantly with samarium concentration. The fluorescence efficiency of Sm +2 as a function of Sm +2 concentration appeared to go to a broad maximum at about 0.1% Sm +2. The fluorescent emission in Ca1-xSrxF2: Sm +2 showed pronounced inhomogeneous line broadening. © 1965, The Electrochemical Society, Inc. All rights reserved.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
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