Chemical characterization of surfaces and interfaces of industrial materials by X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

Heinz Schmid, Hans Biebuyck, et al.

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

F.J. Himpsel, T.A. Jung, et al.

Surface Review and Letters

K.A. Chao

Physical Review B

Q.R. Huang, Ho-Cheol Kim, et al.

Macromolecules