Scripta Metallurgica

Paper

01 Jan 1970

Coincidence diffraction

View publication

Abstract

No abstract available.

Paper

Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction

Albert T. Wu, K.N. Tu, et al.

Applied Physics Letters

Paper

Thermal stability and growth kinetics of Co₂Si and CoSi in thin-film reactions

K.N. Tu, G. Ottaviani, et al.

Journal of Applied Physics

Paper

Solute effect of Cu on interdiffusion in Al3Ti compound films

J. Tardy, K.N. Tu

Physical Review B

Paper

Selective growth of metal-rich silicide of near-noble metals

K.N. Tu

Applied Physics Letters

View all publications