Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The subject of this paper is the design and analysis of Monte Carlo algorithms for two basic matching techniques used in model-based recognition: alignment, and geometric hashing. We first give analyses of our Monte Carlo algorithms, showing that they are asymptotically faster than their deterministic counterparts while allowing failure probabilities that are provably very small. We then describe experimental results that bear out this speed-up, suggesting that randomization results in significant improvements in running time. Our theoretical analyses are not the best possible; as a step to remedying this we define a combinatorial measure of self-similarity for point sets, and give an example of its power. © 1999 Elsevier Science B.V. All rights reserved.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Robert E. Donovan
INTERSPEECH - Eurospeech 2001
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