Combined charge collection and cathodoluminescence (EBIC/CL) characterization of defects

Conference paper

01 Jan 1991

Conference paper

A. Oosenbrug, C. Harder, et al.

LEOS 1996

Conference paper

A. Fried, A. Jakubowicz, et al.

Microscopy of Semiconducting Materials 1991

Paper

A. Jakubowicz

Journal of Applied Physics

Paper

P.W. Epperlein, P. Buchmann, et al.

Applied Physics Letters

Related