The study of the Cu/Al/Au thin film system by electron microscopy
- P.J. Bailey
- P.B. Madakson
- 1991
- Scanning
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Combined charge collection and cathodoluminescence (EBIC/CL) characterization of defects
- A. Jakubowicz
- 1991
- Scanning
The use of the low voltage SEM in IC fabrication
- Michael G. Rosenfield
- 1991
- Scanning
A wet‐cell for soft x‐ray imaging of hydrated biological specimens
- B.J. Panessa
- G. Colemann
- et al.
- 2011
- Scanning
Penetration effect at sharp edges in the scanning electron microscope
- O.C. Wells
- 2011
- Scanning
Ion damage to the specimen in the SEM studied by the EBIC technique
- O.C. Wells
- 2011
- Scanning
Secondary electron detection systems for quantitative voltage measurements
- E. Menzel
- E. Kubalek
- 2011
- Scanning
A circuit for voltage coding synchronizing
- M.J. Immediato
- Keith A. Jenkins
- 2011
- Scanning
Studies of contamination build up in the SEM using the bse imaging technique
- O.C. Wells
- C.F. Aliotta
- 2011
- Scanning
Enhancement of type‐2 magnetic contrast in the bse image in the SEM by a lock‐in technique
- O.C. Wells
- R.J. Savoy
- 2011
- Scanning