Penetration effect at sharp edges in the scanning electron microscope
- O.C. Wells
- 2011
- Scanning
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20 results at Scanning
A wet‐cell for soft x‐ray imaging of hydrated biological specimens
- B.J. Panessa
- G. Colemann
- et al.
- 2011
- Scanning
Ion damage to the specimen in the SEM studied by the EBIC technique
- O.C. Wells
- 2011
- Scanning
A circuit for voltage coding synchronizing
- M.J. Immediato
- Keith A. Jenkins
- 2011
- Scanning
Secondary electron detection systems for quantitative voltage measurements
- E. Menzel
- E. Kubalek
- 2011
- Scanning
Scanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lens
- O.C. Wells
- 2011
- Scanning
Quantitative image mode voltage contrast
- Keith A. Jenkins
- 2011
- Scanning
Electron beam testing of circuits at liquid nitrogen temperature
- Keith A. Jenkins
- M.J. Immediato
- et al.
- 2011
- Scanning
Reduction of edge penetration effect in the scanning electron microscope
- Oliver C. Wells
- 2011
- Scanning
Enhancement of type‐2 magnetic contrast in the bse image in the SEM by a lock‐in technique
- O.C. Wells
- R.J. Savoy
- 2011
- Scanning