E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Much recent research aimed at developing high temperature Josephson junctions for electronics applications is based on superconductor-normal metal-superconductor (SNS) edge junctions which, in some instances, exhibit excellent current-voltage characteristics, high critical current-resistance products, and low noise: We review the data available in the published literature and conclude that, despite the useful performance of these junctions, there is little evidence that the behavior of most reported high-Tc SNS devices can be described by conventional proximity effect theory. © 1995 IEEE
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997