R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Much recent research aimed at developing high temperature Josephson junctions for electronics applications is based on superconductor-normal metal-superconductor (SNS) edge junctions which, in some instances, exhibit excellent current-voltage characteristics, high critical current-resistance products, and low noise: We review the data available in the published literature and conclude that, despite the useful performance of these junctions, there is little evidence that the behavior of most reported high-Tc SNS devices can be described by conventional proximity effect theory. © 1995 IEEE
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Hiroshi Ito, Reinhold Schwalm
JES
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
R. Ghez, J.S. Lew
Journal of Crystal Growth