Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
To extend previous work in the frequency domain, as a function of temperature, the forms of anelastic or dielectric loss peaks are computed directly involving a Gaussian distribution of activation energies. The calculations provide the height, width, asymmetry, and frequency‐shift behavior of the loss peak as a function of a dimensionless parameter defining the width of the distribution. The calculations are used to determine how well the input distribution can be recovered or deconvoluted from a set of peaks, obtained for several different frequencies, by a simple empirical procedure termed a cross‐cut analysis. The procedure is found to work well for peaks whose width is more than twice the Debye width. Copyright © 1987 WILEY‐VCH Verlag GmbH & Co. KGaA
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
R.W. Gammon, E. Courtens, et al.
Physical Review B
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983