Conference paper
Growth and scaling of oxide conduction after breakdown
Barry P. Linder, James H. Stathis, et al.
IRPS 2003
In spite of 50 years of history, there is still no consensus on the basic physics of Negative Bias Temperature Instability. Two competing models, Reaction-Diffusion and Defect-Centric, currently vie for dominance. The differences appear fundamental: one model holds that NBTI is a diffusion-limited process and the other holds that it is reaction-limited. Basic issues of disagreement are summarized and the main controversial aspects of each model are reviewed and contrasted.
Barry P. Linder, James H. Stathis, et al.
IRPS 2003
Miaomiao Wang, X. Miao, et al.
ASICON 2017
Min Yang, Victor W.C. Chan, et al.
IEEE Transactions on Electron Devices
Barry P. Linder, Salvatore Lombardo, et al.
IEEE Electron Device Letters